X-Ray Fluorescence Analysis, energy dispersive (XRFA), according to the Standards DIN ISO 3497 and ASTM B 568
X-ray fluorescence analysis has its basis in the phenomenon that, when atoms in a material sample are excited by the primary X-radiation, electrons from the innermost shells are released; the resultant vacancies are then filled by electrons from the outer shells.
During these transitions, fluorescent radiation is generated that is characteristic for each element. This is read by the detector and provides information on the composition of the sample.
Your contact to FISCHER
Fischer Technology Inc.
Phone: (860) 683-0781
Online contact form