Measuring Systems (XRF) XUV® 773



  • Universal premium instrument with comprehensive measurement capabilities
  • Outfitted with a measurement chamber that can be evacuated, making it possible to analyse light elements beginning at Z=11 (Na)
  • Automated series testing with precise, programmable XYZ-stage
  • Video camera for exact sample positioning and for measuring small sections

Typical fields of application

  • Measurement of light elements
  • Measurement of thin coatings and trace analysis
  • General materials analysis and forensics
  • Non-destructive gemstone analysis
  • Photovoltaic industry 

More Information:

  • Brochure full X-RAY program

High performance X-ray fluorescence (XRF) measuring instrument with vacuum chamber for non-destructive material analysis

Measurements according to DIN EN ISO 3497 and ASTM B 568