FISCHERSCOPE® X-RAY Inline Fluorescence
      Measuring Systems (XRF) X-RAY 5000



  • Flange measuring head for continuous measurements in production lines
  • Proportional counter tube, peltier-cooled silicon PIN diode or silicon drift detector as X-ray detector
  • Quick and easy calibration on a workpiece master directly in the production process
  • For use in air or vacuum
  • Allows measurements even on very hot substrate materials up to 500° C (930° F)
  • Design is focused on maximum robustness and serviceability 

Typical fields of application

  • Photovoltaics (CIGS, CIS, CdTe)
  • Analysis of thin coatings on metal strip, metal foils and plastic films
  • Continuous production
  • Process monitoring of sputter and electroplating production lines
  • Large-area measurement

More Information:

X-ray fluorescence (XRF) measuring system for continuous in-line measurement and analysis of thin coatings, i.e. CIGS, CIS, and CdTe, in production processes

Measurements according to DIN EN ISO 3497 and ASTM B 568