Desktop Analysis Systems

Desktop measurement instruments for material analysis with X-ray fluorescence offer both outstanding accuracy and flexibility. And the Fischer portfolio offers the right measurement solution for a huge range of analytical tasks. Numerous advantages – from the non-destructive measurement procedure to the quick measurement times – make Fischer instruments a profitable investment.

GOLDSCOPE Series

The X-ray fluorescence devices of the GOLDSCOPE family are designed specifically to analyze gold and other precious metals

XAN Series

Measurement instruments for fast and cost-effective analysis of gold jewelry and other precious metals.

XDL Series

The all-rounder: with comprehensive configuration options, XDL instruments are ideal for manual measurements or serial testing of coating thicknesses and material compositions.

XDV-µ Series

High-performance X-ray fluorescence instruments, including models tailored especially to the needs of the electronics and semiconductor industry

XUV

X-ray fluorescence instruments with vacuum chamber for analyzing light elements.

iMOXS

Expand the functions of your atomic force microscope: the modular X-ray source iMOXS enables scanning electron microscope (SEM) and X-ray fluorescence analysis with a single device.

Your contact to FISCHER

Fischer Technology Inc.
Windsor/United States

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Phone: (860) 683-0781
E-Mail: info@fischer-technology.com
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