XDL Series

With motor-driven axes (optional) and measurement direction from top to bottom, the measurement instruments from the XDL® range enable automated serial tests. A variety of versions – differing in their X-ray source, filter, Aperture and detector – make it possible to select the X-ray device with the configuration that best suits your specific measurement task.

XDL Family

Features:

  • X-ray fluorescence instruments for a variety of measurement tasks, made possible through different hardware components
  • Also suitable for testing assembled circuit boards or parts with indentations, due to the variable measuring distance (up to 80 mm)
  • Automated serial testing with programmable XY-table and Z-axis (optional)
  • Ideal for the measurement of very thin layers using the silicon drift detector with high energy resolution (XDAL device)

Applications:

Coating Thickness Measurement

  • Measurement of coatings on large boards and flexible circuit boards (flex PCBs)
  • Thin conductive and/or separating layers on circuit boards
  • Coatings on three-dimensional components
  • Chrome coatings, for example plastic items with decorative chrome finish

Material Analysis

  • Analysis of electroplating baths
  • Analysis of functional coatings in the electronics and semiconductor industry
  • Analysis of hard material coatings, for example CrN, TiN or TiCN

Your contact to FISCHER

Fischer Technology Inc.
Windsor/United States

Contact directly
Phone: (860) 683-0781
E-Mail: info@fischer-technology.com
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