Desktop Measurement Instruments

Fischer's desktop coating thickness instruments – utilizing either X-ray fluorescence or tactile measurement technology with diverse probes – provide unbeatable performance and flexibility. Because of the broad range of measurement techniques they apply, they offer the right solution for any task. Desktop instruments can be integrated easily into production and quality management systems via software and hardware interfaces.

MMS PC2

Modular system for diverse measurement techniques: ideal for variable tasks in connection with coating thickness measurement and material testing.

BETASCOPE

Coating thickness measurement by means of the beta backscatter method: for thin layers even less than 3 µm, as well as soft layers or plastic coatings.

CMS2

Desktop instrument for thickness measurement of virtually all metallic coatings, including multi-layers, on either metallic or non-metallic substrates.

GOLDSCOPE Series

The X-ray fluorescence devices of the GOLDSCOPE family are designed specifically to analyze gold and other precious metals

XAN Series

Measurement instruments for fast and cost-effective analysis of gold jewelry and other precious metals.

XUL Series

Robust instruments based on X-ray fluorescence for fast and cost-effective coating thickness measurement, especially in the electroplating industry.

XDL Series

The all-rounder: with comprehensive configuration options, XDL instruments are ideal for manual measurements or serial testing of coating thicknesses and material compositions.

XDV Series

High-performance X-ray fluorescence instruments for material analysis and coating thickness measurement into the nanometer range and for extremely small measurement surfaces.

XUV

X-ray fluorescence instruments with vacuum chamber for analyzing light elements.

Your contact to FISCHER

Fischer Technology Inc.
Windsor/United States

Contact directly
Phone: (860) 683-0781
E-Mail: info@fischer-technology.com
Online contact form